片電阻測量

Mapping Solutions

EddyCus® TF map 2525SR
EddyCus® TF map 5050SR

  • 非接觸和快速高解析度mapping
  • 片電阻值測量範圍: 0,001 to 1.000 Ohm/sq
  • 具大量數據分析能力

片電阻測量

EddyCus® TF map 2525SR/5050SR i是特別設計,為在玻璃、晶圓,塑膠或箔片上的導電薄膜的測量系統,為單點非接觸式的方法, 即時測量薄厚和片電阻值。這台儀器提供導電薄膜正確又快速的高空間解析度mapping和金屬膜厚的監測 。這台非接觸的mapping 功能,能有利於對以下的製程做品質驗證:

  • 沉積製程
  • 加溫退火製程
  • 參雜製程

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Applications

  • Architectural glass
  • Touch screens and flat monitors
  • OLED applications
  • Smart-glass applications
  • Transparent antistatic foils
  • Photovoltaic cells
  • De-icing and heating applications
  • Batteries
透明薄膜 金屬薄膜
Carbon Nano Tubes and Nano Buds Aluminum
Graphene Films Molybdenum
Metal Nano Wires Silver
Nano Particle Films Copper
and many more and many more
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軟體 & 數據處理

這款片電阻分析儀器具有非常人性化的圖像介面設計和數據預覽。製程測量的結果也可以選擇用圖像分析來表示。 另外,柱狀圖和軟體分析工具也都內建在此軟體中。

  • 快速自動mapping
  • 人性化的統計分析
  • 多種數據分析和數據輸出功能

 

 

 

Mapping Devices

EddyCus® TF map 2525SR /
EddyCus® TF map 5050SR

EddyCus® TF map 2525SR/5050SR 是特別設計為在玻璃、晶圓、塑膠或箔片上的導電薄膜快速mapping的系統,有效使用非接觸式測量方法,可以解決以下不同的需求:

  • 片電阻值監測 [Ohm/sq]
  • 膜厚監測 [nm]
  • 高導電性到低導電性基板厚度監測[µm]

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儀器表現 & 設定

  EddyCus® TF map 2525 SR EddyCus® TF map 5050 SR
Sheet Resistance Measurement Yes
Thickness Measurement Yes
Optical Transmission Optional
Anisotropy Determination Optional
Sheet Resistance & Metal Thickness Measurement Non-Contact Eddy Current Sensor
Substrate Thickness Measurement Ultrasonic Sensor
Max. Scanning Area 10 inch / 254 x 254 mm 20 inch / 508 x 508 mm
Max. Sample Thickness
(defines distances)
2 / 5 / 10 / 14 mm
(Defined by the thickest sample/application)
Sheet Resistance Range 0.001 – 10 Ohm/sq; <2 % accuracy
10 – 100 Ohm/sq; < 3 % accuracy
100 – 1,000 Ohm/sq; < 5 % accuracy
Thickness Mapping of Metal Films (e.g. copper) 2 nm - 2mm
(in accordance with sheet resistance)
Scanning Time @ 1 - 10 mm Measurement Pitch 4 inch / 100 x 100 mm in 0.5 to 5 minutes
8 inch / 200 x 200 mm in 1.5 to 15 minutes
8 inch / 200 x 200 mm in 1.5 to 15 minutes
12 inch / 300 x 300 mm in 3 to 30 minutes
Scanning Pitch 1 / 2 / 5 / 10 mm (other on request)
Device Sizes (h/w/d) 230 / 600 / 800 mm 290 / 1180 / 900 mm
Weight 27.0 kg 120.0 kg
Available Features Metal thickness tester
Anisotropy sheet resistance sensor
Optical transmission sensors at 632 nm wavelength

 

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